Authors
A Sinno, P Ruaux, Luc Chassagne, S Topcu, Y Alayi, Gilles Lerondel, Sylvain Blaize, Aurelien Bruyant, Pascal Royer,
Title
Enlarged atomic force microscopy scanning scope: Novel sample-holder device with millimeter range
In
Review of scientific instruments
Volume
78
Issue
95107
Pages
1–7
Year
2007
Indexed by
Affiliations
Offprint