All-fiber reflection-based scattering NSOM with low phase drift for guided-wave imaging on a chip
Conference on Lasers and Electro-Optics
Optical Society of America
An all-fiber phase-resolved reflection-based near-field scanning optical microscope with a phase-drift-rate of 0.06textdegree/s is developed. By raster scanning atomic force microscope probe, we measure the complex near-fields and analyse the standing-wave-spectrograms in silicon nano-waveguides.