Authors
M. Kemdehoundja, J.L. Grosseau-Poussard, J.F. Dinhut, Benoît Panicaud,
Title
Growth stresses in α -Cr2 O3 thermal oxide films determined by in situ high temperature Raman spectroscopy
In
Journal of Applied Physics
Volume
102
Issue
9
Year
2007
Publisher's URL
http://dx.doi.org/10.1063/1.2805638
Indexed by
Affiliations
Offprint