Peer-reviewed journal articles indexed in international databases

  1. Thomas Santini, Sebastien Morand, Mitra Fouladirad, Florent Miller, Antoine Grall, Bruno Allard,
    Non-homogenous gamma process: Application to SiC MOSFET threshold voltage instability.
    Microelectronics Reliability 75, 14 – 19.
    Elsevier, 2017.
  2. Thomas Santini, Sebastien Morand, Mitra Fouladirad, L. V. Phung, Florent Miller, Bruno Foucher, Antoine Grall, Bruno Allard,
    Accelerated degradation data of {SiC MOSFETs} for lifetime and Remaining Useful Life assessment.
    Microelectronics Reliability 54(9-10), 1718–1723.
    Elsevier, 2014.