Peer-reviewed journal articles indexed in international databases

  1. Thomas Santini, Sebastien Morand, Mitra Fouladirad, Florent Miller, Antoine Grall, Bruno Allard,
    Non-homogenous gamma process: Application to SiC MOSFET threshold voltage instability.
    Microelectronics Reliability 75, 14 – 19.
    Elsevier, 2017.
  2. Thomas Santini, Sebastien Morand, Mitra Fouladirad, L. V. Phung, Florent Miller, Bruno Foucher, Antoine Grall, Bruno Allard,
    Accelerated degradation data of {SiC MOSFETs} for lifetime and Remaining Useful Life assessment.
    Microelectronics Reliability 54(9-10), 1718–1723.
    Elsevier, 2014.

Proceedings articles indexed in international databases

  1. Thomas Santini, Mitra Fouladirad, Antoine Grall, S. Morand, F. Miller, B. Foucher, B. Allard,
    Residual lifetime estimation and high power electronic devices.
    Proceedings of the 25th European Safety and Reliability Conference, ESREL 2015, Zürich, Switzerland, 7-10 Sept. 2015, 6 pages.
    2015.