Authors
Laurent Billot, Marc Lamy De La Chapelle, Dominique Barchiési, S. H. Chang, S.K. Gray, John A. Rogers, A. Bouhelier, Pierre-Michel Adam, Jean-Louis Bijeon, Gary Wiederrecht, Renaud Bachelot, Pascal Royer,
Title
Error signal artifact in apertureless scanning near-field optical microscopy.
In
Applied physics letters
Volume
89
Pages
23105–2310
Publisher
APS
Year
2006
Indexed by
Affiliations
Offprint