Authors
Marcelina Cardoso Dos Santos, Régis Deturche, Cyrille Vézy, Rodolphe Jaffiol,
Title
Axial nanoscale localization by normalized total internal reflection fluorescence microscopy
In
Optics Letters
Volume
39
Issue
4
Pages
869–872
Publisher
OSA
Year
2014
Indexed by
Abstract
We present a simple modification of a standard total internal reflection fluorescence microscope to achieve nano- metric axial resolution, typically ≈10 nm. The technique is based on a normalization of total internal reflection images by conventional epi-illumination images. We demonstrate the potential of our method to study the adhesion of phopholipid giant unilamellar vesicles.
Affiliations
Offprint