Authors
Thomas Santini, Sebastien Morand, Mitra Fouladirad, L. V. Phung, Florent Miller, Bruno Foucher, Antoine Grall, Bruno Allard,
Title
Accelerated degradation data of {SiC MOSFETs} for lifetime and Remaining Useful Life assessment
In
Microelectronics Reliability
Volume
54
Issue
9-10
Pages
1718–1723
Publisher
Elsevier
Year
2014
Indexed by
Affiliations
Offprint