Authors
F. Lefebvre, E. Wasniewski, M. Francois, J. Cacot, P. Le-Bec, E. Baumhauer, D. Bouscaud, T. Bergey, D. Blaize, D. Gloaguen, A. Cosson, S. Jegou, Y. Cheynet, S. Leray, M. Meheux, J.C. Monvoisin, P. Allain, J.C. Vidal, J.M. Sprauel, P. Goudeau, C. Charles, L. Daflon, C. Fischer, L. Desmas, A. Ouakka, M.J. Moya, Y. Bordiec, H. Hamdi,
Title
External reference samples for residual stress analysis by X-ray diffraction
In
Advanced Materials Research
Volume
996
Pages
221–227
Publisher
Trans Tech Publications
Year
2014
Publisher's URL
http://dx.doi.org/10.4028/www.scientific.net/AMR.996.221
Indexed by
Affiliations
Offprint