Authors
Remy La, Bruno Benoist, Benoit De Barmon, Régis Lengellé, Paul Gaillard, Jacques Reuchet,
Title
An Eddy Current Parametric Model for Flaw Characterization
In
Proceedings of the 14th World Conference on Non Destructive Testing, New Delhi, India, December 1996
Pages
4
Year
1996
Indexed by
Affiliations
Offprint