Authors
Mathieu Guérain, Philippe Goudeau, Benoît Panicaud, Jean-Luc Grosseau-Poussard,
Title
Local stress determination in chromia-former thanks to Micro-Raman Spectroscopy : a way to investigate spontaneous delamination processes
In
Journal of Applied Physics
Volume
113
Pages
063502
Publisher
AIP Publishing
Year
2013
Indexed by
Abstract
Spontaneous delamination process for a-Cr2O3 thermal oxide films growing on NiCr-30 alloys is studied thanks to micro Raman spectroscopy. In particular, stress maps are performed through and around buckles developed on chromia films. Depending on the cooling rate at the end of the oxidation process, different buckle types appear which are investigated. Associated residual stress distribution clearly evidences the stress release field. In addition, geometrical features are determined for the different buckle types, and from comparison with modelling describing buckle formation and propagation, it is possible to get the interface toughness distribution.
Affiliations
Offprint