Authors
Felaniaina Rakotovao, Zhaojun Tao, Jean-Luc Grosseau-Poussard, Benoît Panicaud, Gilles Bonnet, Patrick Girault, Mathieu Guerain,
Title
Determination of residual stress fields in a thermally grown oxide under thermal cycling loadings, using XRD and Raman spectroscopy. Correlations with microstructural states
In
Advanced Materials Research
Volume
996
Pages
890–895
Publisher
Trans Tech Publications
Year
2014
Indexed by
Abstract
The presence of residual stresses in thermal oxide layers has been recognized for a long time. In the present work, the mechanical fields for chromia oxide are determined either by XRD or Raman spectroscopy. In addition, the microstructure of the chromia films is investigated ant its influence on the evolution of the stress release processes is analyzed.
Affiliations
Offprint