Growth stresses in α -Cr2 O3 thermal oxide films determined by in situ high temperature Raman spectroscopy — Record

Authors

M. Kemdehoundja, J.L. Grosseau-Poussard, J.F. Dinhut, Benoît Panicaud,

Title

Growth stresses in α -Cr2 O3 thermal oxide films determined by in situ high temperature Raman spectroscopy

In

Journal of Applied Physics

Volume

102

Issue

9

Year

2007

Publisher's URL

http://dx.doi.org/10.1063/1.2805638

Indexed by

Referenced by SCOPUS

Affiliations

Offprint