Peer-reviewed journal articles indexed in international databases

  1. Yuchen Zhao, Carl Labergère, Benoit Panicaud, Jean Grosseau-Poussard, Pascal Goudeau,
    Modeling of stress and strain fields induced during the Smart-Cut process on silicon. Influence of different couplings for diffusion of hydrogen at a microscopic scale.
    Advanced Materials research 996, 707–712.
    Materials science and engineering, 2014.