Peer-reviewed journal articles indexed in international databases

  1. Sun, H., Arab Pour Yazdi, M., Ducros, C., (...), Sanchette, F., Billard, A.,
    Thickness-dependent optoelectronic properties of CuCr0.93Mg0.07O2thin films deposited by reactive magnetron sputtering.
    Materials Science in Semiconductor Processing 63, 295–302.
  2. Wang, J., Yazdi, M.A.P., Lomello, F., (...), Sanchette, F., Dong, Z.L.,
    The Yttrium Effect on Nanoscale Structure, Mechanical Properties, and High-Temperature Oxidation Resistance of (Ti0.6Al0.4)1–xYxN Multilayer Coatings.
    Metallurgical and Materials Transactions A: Physical Metallurgy and Materials Science 48(9), 4097–4110.
  3. de Monteynard, A., Schuster, F., Billard, A., Sanchette, F.,
    Properties of chromium thin films deposited in a hollow cathode magnetron powered by pulsed DC or HiPIMS.
    Surface and Coatings Technology 330, 241–248.
  4. Sun, H., Chen, S.-C., Wen, C.-K., (...), Sanchette, F., Billard, A.,
    p-type cuprous oxide thin films with high conductivity deposited by high power impulse magnetron sputtering.
    Ceramics International 43(8), 6214–6220.
  5. Slim, M.F., Alhussein, A., Billard, A., Sanchette, F., François, M.,
    On the determination of Young's modulus of thin films with impulse excitation technique.
    Journal of Materials Research 32(3), 497–511.
  6. Wang, J., Yazdi, M.A.P., Lomello, F., (...), Sanchette, F., Dong, Z.,
    Influence of microstructures on mechanical properties and tribology behaviors of TiN/TiXAl1 − XN multilayer coatings.
    Surface and Coatings Technology 320, 441–446.
  7. Slim, M.F., Alhussein, A., Sanchette, F., Guelorget, B., François, M.,
    An enhanced formulation to determine Young's and shear moduli of thin films by means of Impulse Excitation Technique.
    Thin Solid Films 631, 172–179.
  8. Sun, H., Yazdi, M.A.P., Chen, S.-C., (...), Sanchette, F., Billard, A.,
    Ag composition gradient CuCr0.93Mg0.07O2/Ag/CuCr0.93Mg0.07O2 coatings with improved p-type optoelectronic performances.
    Journal of Materials Science 52(19), 11537–11546.